ARL Testing

AMERICAN RELIABILITY LAB, INC.

Contact Information:

Telephone: 781-321-7401, 7402, 7403, 7404, 781-324-8298

Fax: 781-321-3980, 9527

e-mail: arltesting@aol.com

Address: 150 CHARLES STREET MALDEN, MA 02148

We offer our customers one stop service:

Electronic Testing / Temperature Screening / Marking / Lead Forming / Dry Packing / Tape and Reel / Barcode Labeling / Special Packaging

ARL's Policy:

The commitment of ARL, Inc. is to provide a cost efficient, automatic electronic component testing service to assist our customers on the road to high reliability in their products. We maintain competitive pricing, quick delivery, and extensive engineering capability, thereby allowing us a most important partnering position supporting our customers. Our Management and Engineering staff has over 30 years experience in Military Standard electronic component testing.

Services:

ARL, Inc. is ISO 9002 compliant. We screen to MIL-STD-750 & 883. Class level S & B screening per method 5004. Group A - D per method 5005. Simple to complex Memory screening, Memory Modules, LSI, VLSI devices, the full range of semiconductors available today. We maintain Fairchild & Schlumberger test systems, STI discrete systems, Hast, Fine and Gross Leak, Temptronics temperature forcing systems, Memory erasing capabilities, Service Mount and Axial tape & reel, re-tinning to MIL-STD-2002, over 500,000 burn in positions for all types and packages.

Company Profile:

American Reliability Testing labs was incorporated in September of 1969 to serve the Electronics Manufacturing Companies that required a 100% Quality and Reliability level of components not available in the technology of the day. Over the years we have grown and maintained our position as one of the largest independent micro electronics testing facility serving both the Commercial and Military sectors of the technology. We operate three shifts, six days a week to maintain turnarounds that are in line with our customer's requirements.

	Small Scale - Medium Scale Integrated circuit Automatic testing systems, with handlers hot and cold to facilitate Mil grade or Industrial grade screening
Memory Screening test systems in conjunction with temperature forcing systems -65 deg C to 200 deg C screening is available
	Linear testing systems processing OP Amps, D to A, A to D Converters and other analog families, and specific devices
ARL Bombing system for Fine and Gross leak screening, This system bombs with Helium or Freon to set up devices for subsequent Fine and/or Gross leak screening.
	Fine leak system, screens package integrity, This is a Mil screening requirement, 883, 202 and 750.
Gross leak screening system Military approved, Mil 883, Mil 750 & Mil 202.

	Test system for Burn In trays, Full Mil rated. All trays are tested prior to loading, for burn in.
One of many assorted Automatic device handlers, that include High temperature and low temperature capabilities.
	Typical Performance Board for the LSI Test Systems, these performance boards act as an interface with the test system.
Particle Impact Noise Detection (PIND) Testing Station. This system screens for loose particles that may create a failure in the field.
	LSI & VLSI Testing and screening area. These systems encompass the screening and evaluation of all types of devices Memories and Microprocessors etc.
Partial view of Burn In Oven Area. These ovens are backed by an inventory of over 600,000 assorted Burn in positions encompassing many package types.
	Sentry Master System Program generation. LSI & VLSI software is written in house. These systems are dedicated to Engineering, but are available utilized by Production.
Partial view of Burn in tray stockroom encompassing diodes through surface mount LSI devices. over 600,000 Device positions of varying package styles are available.
	STI full Mil rated test system for diodes through Transistors, FETs, Regulators and many other discrete devices to numerous to mention here.
Large scale and very Large scale devices are addressed with these systems, software for screening is generated via these systems, in house by our engineering staff.

Programming center SSI / MSI software

for these types of devices are generated

by our engineering staff.

HAST, Highly Accelerated Temperature

and Humidity Stress Test, this test is

designed to assess moisture resistance

of encapsulated integrated circuits.